广州万浩光电科技有限公司
SIL8000 圆晶自动进样器
High speed, safe and smooth wafer handling
Automatic wafer size detection
Full set of inspection type come as standard: All wafers, programmed, random and statistical
Cassette laser mapping, wafer protrusion, cross-slot detection and critical handling conditions come as standard safety features
PC based controller, Windows 10
Touch screen interface
Designed for Leica DM8000, compatible with many semiconductor inspection microscopes like Nikon, Olympus, Zeiss
Basic bright light inspection available as option
您感兴趣的产品PRODUCTS YOU ARE INTERESTED IN
Three-Way Liquid Sampler三路液体进样器
Three-Way Liquid Sampler三路液体进样器 面议60180-6008mm 未组装透明螺纹自动进样器样品瓶套件
60180-600 面议纺织服装机械网 设计制作,未经允许翻录必究 .
请输入账号
请输入密码
请输验证码
请输入你感兴趣的产品
请简单描述您的需求
请选择省份